US Patent 11537942 Machine learning-based data analyses for outlier detection

Techniques are described for providing a machine learning (ML) data analytics application including guided ML workflows that facilitate the end-to-end training and use of various types of ML models, where such guided workflows may also be referred to as ML “experiments.” One such model is an outlier detection model to assist in the monitoring of computer network traffic and computer performance. For example, the ML data analytics application may generate an outlier detection model using user-identified data from a data source and parameter information. The generates outlier detection model can include distribution functions of distribution types selected from a plurality of distribution types by a distribution fitting algorithm.