US Patent 11538375 Pixel circuit and testing method

The disclosure relates to a pixel circuit and a testing method of the pixel circuit. The pixel circuit comprises a light emitting element, a storage capacitor Cst, a drive sub-circuit, a reset sub-circuit, a write sub-circuit, a light emission control sub-circuit and a testing element, wherein a control terminal of the testing element is connected to s reset control signal line, a first terminal of the testing element is connected to a reset signal line, a second terminal of the testing element is connected to the drive sub-circuit, and the testing element is configured to test elements included in the pixel circuit.