US Patent 11544138 Framework for anomaly detection and resolution prediction

A method comprises collecting operational data for one or more devices and identifying one or more anomalies associated with the one or more devices based at least in part on the collected operational data. At least a portion of the collected operational data corresponding to the identified one or more anomalies is analyzed, and a probability of automatic resolution for respective ones of the identified one or more anomalies is determined based at least in part on the analysis. The identifying, the analyzing and the determining are performed using one or more machine learning models.