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US Patent 11545207 Semiconductor memory device
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Patent
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Date Filed
July 28, 2021
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Date of Patent
January 3, 2023
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Patent Applicant
Winbond
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Patent Application Number
17387757
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Patent Citations
US Patent 10176107 Methods and systems for dynamic DRAM cache sizing
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US Patent 10957376 Refresh testing circuit and method
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US Patent 11139016 Read refresh operation
US Patent 11482297 Test method for self-refresh frequency of memory array and memory array test device
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Patent Inventor Names
Takahiko Sato
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11545207
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Patent Primary Examiner
Fernando Hidalgo
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CPC Code
G11C 11/4096
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G11C 2211/4061
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G11C 11/40615
0
G11C 11/40626
0
G11C 2211/4066
0
G11C 11/40611
0
G11C 11/4078
0
G11C 11/4076
0
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