US Patent 11555694 Method and system for controlling a laser profiler

A method for controlling a laser profiler, the laser profiler being configured for generating a laser line on a surface to be inspected, the method comprising: receiving an image of the laser line; determining an actual intensity of the laser line; calculating an amplification factor for the laser line based on the actual intensity of the laser line, a target intensity for the laser line, a power of the laser, a camera gain of the camera and an exposure time of the laser line on the surface to be inspected, the amplification factor allowing the actual intensity of the laser line to reach the target intensity while minimizing the power of the laser; and based on the calculated amplification factor, adjusting at least one parameter of the laser profiler so that the actual intensity of the laser line corresponds to the target intensity.