Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
February 21, 2023
Patent Application Number
17643985
Date Filed
December 13, 2021
Patent Citations
Patent Primary Examiner
CPC Code
A system for and methods of semiconductor testing and characterization are disclosed. The system includes a parallel dipole line (PDL) system for applying a magnetic field to a sample in a measurement chamber and electrical equipment for testing the sample. The testing includes applying a first light exposure to the sample with the PDL system set to zero magnetic field and monitoring longitudinal resistance (R
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