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Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
February 21, 2023
Patent Application Number
17402065
Date Filed
August 13, 2021
Patent Citations
...
Patent Primary Examiner
Methods and apparatus for nonuniformity correction (NUC) for a sensor having an avalanche photodiode (APD) array and an integrated circuit. The sensor can include anode bias control module, a passive mode module, and an active mode module. DC photocurrent from the APD array can be measured and used for controlling an anode reverse bias voltage to each element in the APD to achieve a nonuniformity correction level less than a selected threshold.
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