US Patent 11592406 Detection scheme for x-ray small angle scattering
Patent 11592406 was granted and assigned to Rensselaer Polytechnic Institute on February, 2023 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 1, 2022
Date of Patent
February 28, 2023
Patent Applicant
Patent Application Number
17711171
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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