Patent attributes
Systems and methods for detecting surface anomalies are disclosed. For example, a computer-implemented method for detecting surface anomalies on an object comprises receiving measured electromagnetic radiation (EMR) profiles for the object, generating synthetic EMR profiles for the object based on the measured EMR profiles, determining whether the object contains a surface anomaly based on the measured EMR profiles and the synthetic EMR profiles, and indicating a surface anomaly to a user via a display when a surface anomaly is detected. In another example, a system comprises a computing device comprising non-transitory memory with computer-readable instructions for receiving unpaired image data of an object of two different image types, predicting missing image data to generate paired image data of the two different image types, and determining whether the object contains a surface anomaly based on the paired image data. The computing device comprises a processor configured to execute the computer-readable instructions.
