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US Patent 11631169 Inspection of noisy patterned features
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Patent
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Date Filed
August 2, 2020
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Date of Patent
April 18, 2023
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Patent Application Number
16945922
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Patent Citations
US Patent 10607119 Unified neural network for defect detection and classification
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Patent Inventor Names
Yong Zhang
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Tao Luo
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11631169
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Patent Primary Examiner
Samir A. Ahmed
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CPC Code
G06T 2207/20081
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G06T 2207/30136
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G06T 7/0006
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G06T 2207/20084
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G06T 7/001
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G06T 2207/30148
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G06T 2207/10061
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