Patent attributes
The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.
