US Patent 11669672 Regression test method, electronic device and storage medium

There is provided a regression test method, an electronic device and a storage medium, and relates to the field of artificial intelligence, such as artificial intelligence chips, cloud computing, intelligent voices, or the like. The method includes: when execution of any regression test is completed, determining a to-be-adjusted test case from test cases according to a current test result; and adjusting a randomization weight corresponding to a data range randomized by the to-be-adjusted test case in a current test.