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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
June 13, 2023
0Patent Application Number
170134190
Date Filed
September 4, 2020
0Patent Primary Examiner
A memory device to perform a read disturb scan of unprogrammed memory cells. In one approach, a test read is performed on unprogrammed memory cells in a first memory block of a storage media (e.g., NAND flash) to provide a test result. Based on the test result, a portion of the unprogrammed cells for which a threshold voltage is above a predetermined voltage is determined. A determination is made whether the portion of the unprogrammed memory cells exceeds a predetermined limit. In response to determining that the portion exceeds the predetermined limit, data is moved from the first memory block to a second memory block of the storage media.
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