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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
June 20, 2023
0Patent Application Number
173164530
Date Filed
May 10, 2021
0Patent Citations
Patent Primary Examiner
System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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