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Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
June 20, 2023
0Patent Application Number
165590080
Date Filed
September 3, 2019
0Patent Citations
Patent Primary Examiner
Systems, methods, and apparatuses for generating a subsurface image using diffraction energy information are disclosed. The systems, methods, and apparatuses may include converting a shot gather into one or more plane-wave gather using a Radon transform. The plane-wave gathers may be extrapolated into source-side wavefields and receiver-side wavefields and further generate a pseudo dip-angle gather. The diffraction energy information may be extracted from the pseudo dip-angle gather, and an image containing subsurface features may be generated from the extracted diffraction energy information. The receiver-side wavefields may be decomposed using a recursive Radon transform.
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