Create
Log in
Sign up
Golden has been acquired by ComplyAdvantage.
Read about it here ⟶
US Patent 11688052 Computer assisted weak pattern detection and quantification system
Overview
Structured Data
Issues
Contributors
Activity
Access by API
Access by API
Is a
Patent
0
Date Filed
August 10, 2020
0
Date of Patent
June 27, 2023
0
Patent Application Number
16989849
0
Patent Citations
US Patent 9355208 Detecting defects on a wafer
0
US Patent 11526979 Method of defect classification and system thereof
0
US Patent 10859926 Methods for defect validation
0
US Patent 11527405 In-die metrology methods and systems for process control
0
US Patent 7853920 Method for detecting, sampling, analyzing, and correcting marginal patterns in integrated circuit manufacturing
0
US Patent 8607169 Intelligent defect diagnosis method
0
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
11688052
0
Patent Primary Examiner
Wesley J Tucker
0
CPC Code
G06T 2207/10061
0
H01L 22/12
0
H01L 22/20
0
G06T 2207/30148
0
G06T 7/0004
0
Find more entities like US Patent 11688052 Computer assisted weak pattern detection and quantification system
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Company
Home
Press & Media
Blog
Careers
WE'RE HIRING
Products
Knowledge Graph
Query Tool
Data Requests
Knowledge Storage
API
Pricing
Enterprise
ChatGPT Plugin
Legal
Terms of Service
Enterprise Terms of Service
Privacy Policy
Help
Help center
API Documentation
Contact Us
SUBSCRIBE