US Patent 11692910 Abnormality diagnostic device, abnormality diagnostic method, and program

An abnormality diagnostic device includes a diagnoser configured to diagnose a type of abnormality that occurs in an abnormality diagnostic target on the basis of differences between abnormality simulation results for each type of abnormalities obtained by simulating a plurality of types of abnormalities in the abnormality diagnostic target and a plurality of time-series observation results obtained by observing the abnormality diagnostic target in time series using a plurality of detectors.