US Patent 11695894 Automatic profile contour artifact detection

A system and method provide for automated evaluation of reference point pairs. For each of a set of reference point pairs in an input color space, a straight line connecting the reference points is sampled to generate a set of sampled points. Each of the set of sampled points in the input color space is converted to a sampled point in an output color space. For each of a set of color separations in the output color space, discontinuities are identified, based on the set of sampled points in the output color space. Candidate reference point pairs are identified in the set of reference point pairs for which at least one discontinuity is identified. The candidate reference point pairs can be validated by printing test sweeps, which are each derived from a respective set of sampled points in the output color space, and identifying contour artifacts in the printed test sweeps.