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US Patent 11698390 High-frequency data differential testing probe
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Patent
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Date Filed
September 7, 2021
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Date of Patent
July 11, 2023
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Patent Application Number
17468442
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Patent Citations
US Patent 7898276 Probe card with stacked substrate
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US Patent 7659790 High speed signal transmission line having reduced thickness regions
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US Patent 7501839 Interposer and test assembly for testing electronic devices
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11698390
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Patent Primary Examiner
Akm Zakaria
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CPC Code
G01R 1/06755
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G01R 1/07342
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G01R 31/2886
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G01R 1/06772
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G01R 1/07392
0
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