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US Patent 11701077 Coded-mask-based X-ray phase-contrast and dark-field imaging
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Patent
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Date Filed
February 25, 2021
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Date of Patent
July 18, 2023
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Patent Application Number
17185387
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Patent Citations
US Patent 11073427 Wavefront sensor and method of reconstructing distorted wavefronts
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US Patent 9952163 Coded-aperture X-ray imaging
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US Patent 10993686 Phase contrast imaging method
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US Patent 7463712 Scatter correction for x-ray imaging using modulation of primary x-ray spatial spectrum
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US Patent 7623614 Apparatus for inspecting objects using coded beam
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US Patent 7693256 Phase-contrast X-ray imaging
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US Patent 8194821 Methods, systems, and computer-program products to correct degradation in tomographic images caused by extraneous radiation
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11701077
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Patent Primary Examiner
Allen C. Ho
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CPC Code
A61B 6/035
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A61B 6/4035
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A61B 6/4291
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A61B 6/484
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A61B 6/52
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A61B 6/5205
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A61B 6/5211
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A61B 6/4085
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G21K 1/02
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G21K 1/025
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