US Patent 11703466 Sample inspection system
Patent 11703466 was granted and assigned to HALO X RAY TECHNOLOGIES LIMITED on July, 2023 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
February 22, 2021
0
Date of Patent
July 18, 2023
0
Patent Applicant
Patent Application Number
17909683
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Patent Citations Received
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Patent Number
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