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US Patent 11704220 Machine learning based data monitoring

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
117042200
Date of Patent
July 18, 2023
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Patent Application Number
177174080
Date Filed
April 11, 2022
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Patent Citations
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US Patent 10270668 Identifying correlated events in a distributed system according to operational metrics
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US Patent 10331357 Tracking stores and loads by bypassing load store units
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US Patent 10331657 Contention analysis for journal-based databases
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US Patent 11227162 Multilayer information dynamics for activity and behavior detection
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US Patent 10346434 Partitioned data materialization in journal-based storage systems
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US Patent 11301351 Machine learning based data monitoring
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US Patent 9460399 Dynamic event driven storage system optimization
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US Patent 10198346 Test framework for applications using journal-based databases
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Patent Primary Examiner
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Mohammad K Islam
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CPC Code
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G06F 17/15
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G06F 2201/87
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G06N 20/00
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G06F 11/3452
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G06F 11/3409
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An overall performance metric of a computer system may be determined for each bin of the set of analysis bins. In case one or more bins of the set of analysis bins do not have at least a predefined minimum number of records, a new set of analysis bins may be redefined by joining analysis bins of the set of analysis bins. For each bin of the redefined set of bins a machine learning (ML) performance metric of the ML model may be computed. The ML performance metric may be estimated for the set of analysis bins using the ML performance metrics of the redefined bins. The computer system may be configured based on a correlation over the set of analysis bins between the computed overall performance metric and the ML performance metric.

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