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Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
July 25, 2023
0Patent Application Number
163029110
Date Filed
May 18, 2017
0Patent Citations
Patent Citations Received
Patent Primary Examiner
Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.
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