US Patent 11709621 Read threshold management and calibration

A system and method for read threshold calibration in a non-volatile memory are provided. Physical dies in the memory are divided into groups based on device-level parameters such as time and temperature parameters. An outlier die may be identified outside of the plurality of groups based on a comparison of a bit error rate (BER) indicator for each die to a threshold. For each group of dies, a read parameter is determined for at least one die, and applied to each of the plurality of dies of the group. The read parameter may be determined based on a threshold measurement of a representative one or more word lines.