US Patent 11711259 Method, system and apparatus for detecting device malfunctions
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US Patent 11711259 Method, system and apparatus for detecting device malfunctions
Article
An example method of detecting device malfunctions at a subject device includes: obtaining a device event indicator representing an event detected at a device sensor of the subject device; obtaining an external event indicator representing an external event detected by an environmental sensor, the external event occurring external to the subject device; and identifying a device malfunction at the subject device based on the device event indicator and the external event indicator.
Infobox
Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
117112590
Date of Patent
July 25, 2023
0Patent Application Number
171751750
Date Filed
February 12, 2021
0Patent Citations
Patent Primary Examiner
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