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US Patent 11712837 Optical scanning for industrial metrology
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Patent
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Current Assignee
Inkbit
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Date Filed
May 4, 2021
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Date of Patent
August 1, 2023
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Patent Applicant
Inkbit
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Patent Application Number
17307487
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Patent Citations
US Patent 10011071 Additive manufacturing using density feedback control
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US Patent 10252466 Systems and methods of machine vision assisted additive fabrication
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US Patent 10456984 Adaptive material deposition for additive manufacturing
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US Patent 10725446 Method and device for calibrating multiple energy rays for the additive manufacturing of an object
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US Patent 10994490 Calibration for additive manufacturing by compensating for geometric misalignments and distortions between components of a 3D printer
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US Patent 10926473 Multi-material scanning for additive fabrication
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US Patent 8237788 Methods of automatic geometric calibration using laser scanning reflectometry
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US Patent 9259931 System and method for print head alignment using alignment adapter
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US Patent 9562759 Optical coherence tomography technique
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US Patent 9697604 Image capturing device and method for detecting image deformation thereof
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•••
Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11712837
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Patent Primary Examiner
Galen H Hauth
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CPC Code
B33Y 10/00
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B29C 64/135
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B29C 64/205
0
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