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US Patent 11761750 Multi-environment Rayleigh interferometer

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
February 25, 2022
Date of Patent
September 19, 2023
Patent Application Number
17675179
Patent Citations
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US Patent 10323981 Compact interferometer
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US Patent 10488175 Multi wavelength multiplexing for quantitative interferometry
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US Patent 7372577 Monolithic, spatially-separated, common path interferometer
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US Patent 7995208 Monolithic interferometer with optics of different material
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US Patent 8422026 Spectrally controllable light sources in interferometry
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US Patent 8441649 Multi-beam interferometer displacement measuring system utilized in a large measuring range
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US Patent 8570524 Stable monolithic interferometer for wavelenghth calibration
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US Patent 9046412 Compact interferometer spectrometer
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US Patent 9062957 Multi-wavelength interferometer, measurement apparatus, and measurement method
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US Patent 9551563 Multi-axis differential interferometer
Patent Inventor Names
Aaron Pung
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11761750
Patent Primary Examiner
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Michelle M Iacoletti
CPC Code
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G01B 9/02
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G01B 9/02057
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G01B 9/02027
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G01B 9/02028
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G01B 2290/70
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G01J 3/0259
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G02B 6/29349
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G01B 9/02051
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G01B 9/0203

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