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US Patent 11762013 Integrated circuit profiling and anomaly detection

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
April 16, 2019
Date of Patent
September 19, 2023
Patent Application Number
17047243
Patent Citations
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US Patent 7818601 Method and apparatus for data transfer
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US Patent 9490787 System and method for integrated circuit clock distribution
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US Patent 9536038 Method and algorithm for functional critical paths selection and critical path sensors and controller insertion
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US Patent 9564883 Circuitry and method for timing speculation via toggling functional critical paths
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US Patent 9564884 Circuitry and method for measuring negative bias temperature instability (NBTI) and hot carrier injection (HCI) aging effects using edge sensitive sampling
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US Patent 9632126 Circuit of measuring leakage current in a semiconductor integrated circuit
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US Patent 9714966 Circuit aging sensor
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US Patent 9760672 Circuitry and method for critical path timing speculation to enable process variation compensation via voltage scaling
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US Patent 9791834 Fast digital to time converter linearity calibration to improve clock jitter performance
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US Patent 9954455 Constant on time COT control in isolated converter
•••
Patent Inventor Names
Evelyn Landman
Yahel David
Eyal Fayneh
Yair Talker
Shai Cohen
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11762013
Patent Primary Examiner
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Samir W Rizk
CPC Code
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G01R 31/31707
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G01R 31/2803
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G01R 31/2894
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G01R 31/31718
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G06N 3/08
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G06N 7/005

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