US Patent 11781862 Multi-probe non-destructive inspection system

Disclosed herein is a non-destructive inspection system. The non-destructive inspection system comprises a motion platform and a tool assembly. The tool assembly is coupled to the motion platform such that the tool assembly is movable relative to the motion platform. The tool assembly comprises an inspection tool assembly that comprises a base structure coupled to the tool assembly and a plurality of probe assemblies coupled to the base structure. Each probe assembly comprises a first linear actuator and a probe, different from the probe of any other one of the plurality of probe assemblies, for inspecting a different structural feature of a structure. Each probe is moveable, along a first axis relative to another one of the probes and substantially perpendicular to the base structure, using the first linear actuator of the corresponding one of the plurality of probe assemblies.