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US Patent 11785761 Semiconductor memory devices
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Patent
Date Filed
April 26, 2021
Date of Patent
October 10, 2023
Patent Application Number
17240486
Patent Citations
US Patent 7947553 Method for fabricating semiconductor device with recess gate
US Patent 8053315 Method to manufacture split gate with high density plasma oxide layer as inter-polysilicon insulation layer
US Patent 8120099 Semiconductor device with buried gate and method for fabricating the same
US Patent 8975140 Semiconductor device having passing gate and method for fabricating the same
US Patent 9136135 Method of fabricating semiconductor device
US Patent 9391206 Methods of forming transistors
US Patent 9570404 Flexible Crss adjustment in a SGT MOSFET to smooth waveforms and to avoid EMI in DC-DC application
US Patent 9530883 Insulated gate semiconductor device having a shield electrode structure and method
US Patent 9673276 Semiconductor device and method of fabricating the same
US Patent 7902597 Transistors with laterally extended active regions and methods of fabricating same
•••
Patent Inventor Names
Junsoo Kim
Wonsok Lee
Min Hee Cho
Satoru Yamada
Yoosang Hwang
Hui-Jung Kim
Bong-Soo Kim
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11785761
Patent Primary Examiner
Bo Fan
CPC Code
H01L 27/10876
H01L 27/10823
H01L 29/4966
H01L 27/10891
H01L 21/28088
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