US Patent 11802838 Rapid high amylose wheat seed purity test

Described herein are methods for quickly measuring properties of grain kernels. The methods allow for a quick, qualitative assessment of high amylose content in the grain kernel. The methods described herein allow for the assessment of high amylose content in wheat in either a laboratory setting or in the field with a minimum of equipment required. The results of these methods may be used to determine if high amylose kernels have been contaminated with normal or low amylose kernels.