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US Patent 11835337 Interferometry assembly having optical paths through different materials

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
December 27, 2021
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Date of Patent
December 5, 2023
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Patent Application Number
17646080
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Patent Citations
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US Patent 7952724 Interferometer with multiple modes of operation for determining characteristics of an object surface
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US Patent 8004750 Multiple-FSR DPSK demodulator
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US Patent 10612906 Optical locker using first and second transparent materials for path length independence from temperature
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US Patent 9062957 Multi-wavelength interferometer, measurement apparatus, and measurement method
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US Patent 11215440 Interferometry assembly for use in an optical locker
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US Patent 6943889 Athermal interferometric device
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US Patent 7133136 Wavelength monitor
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Patent Inventor Names
Adrian Perrin Janssen
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11835337
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Patent Primary Examiner
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Michael P LaPage
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CPC Code
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G01B 9/02051
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G01B 9/02049
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G01J 3/453
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G01J 9/0246
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H04B 10/572
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H01S 5/0687
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G02B 6/12011
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G02B 6/1203
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G02B 6/122
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G02B 6/125
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