US Patent 11836431 Integrated circuit composite test generation
Patent 11836431 was granted and assigned to Ansys on December, 2023 by the United States Patent and Trademark Office.
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US Patent 11836431 Integrated circuit composite test generation
Article
Patent abstract
A chip package system comprising N multiple processor cores can be tested by receiving a data file characterizing the chip package system. Thereafter, simulation testing is conducted for each core for each of M
Infobox
Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Altan Odabasi0
Aveek Sarkar0
John Lee0
Murat Becer0
Scott Johnson0
William Mullen0
Date of Patent
December 5, 2023
0Patent Application Number
173495680
Date Filed
June 16, 2021
0Patent Citations
Patent Primary Examiner
CPC Code
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