US Patent 11837455 Sample analysis systems and methods of use thereof
Patent 11837455 was granted and assigned to Purdue Research Foundation on December, 2023 by the United States Patent and Trademark Office.
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US Patent 11837455 Sample analysis systems and methods of use thereof
Article
Patent abstract
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Pu Wei0
Robert Graham Cooks0
Zane Baird0
Date of Patent
December 5, 2023
0Patent Application Number
178319510
Date Filed
June 3, 2022
0Patent Citations
0
Patent Primary Examiner
CPC Code
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