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US Patent 11842472 Object defect correction
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Is a
Patent
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Date Filed
March 31, 2020
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Date of Patent
December 12, 2023
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Patent Application Number
16835785
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Patent Citations
US Patent 7283659 Apparatus and methods for searching through and analyzing defect images and wafer maps
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US Patent 8607169 Intelligent defect diagnosis method
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Patent Inventor Names
Jian Xu
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Jinfeng Li
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JingChang Huang
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Fan Li
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Jun Zhu
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Guo Qiang Hu
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11842472
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Patent Primary Examiner
Amandeep Saini
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CPC Code
G06K 9/6257
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G06K 9/6288
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G06K 9/6268
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G06N 20/00
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G06V 2201/06
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G06T 7/0002
0
G06T 2207/30148
0
G06T 2207/30141
0
G06T 2207/30121
0
G06T 2207/20212
0
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