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US Patent 11842891 Ion detector
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Patent
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Date Filed
April 8, 2021
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Date of Patent
December 12, 2023
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Patent Application Number
17225514
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Patent Citations
US Patent 10580633 Systems and methods for conducting neutral loss scans in a single ion trap
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US Patent 10755907 Method of producing a mass spectrum
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US Patent 10872755 Low power mass analyzer and system integrating same for chemical analysis
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US Patent 10903061 Methods for crosstalk compensation
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US Patent 10937638 Systems and methods for performing multiple precursor, neutral loss and product ion scans in a single ion trap
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US Patent 10984999 Device for detecting charged particles and an apparatus for mass spectrometry incorporating the same
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US Patent 11024491 Hybrid mass spectrometer
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US Patent 11069516 Electro static linear ion trap mass spectrometer
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US Patent 11075067 Ion analysis device and ion dissociation method
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US Patent 11107670 Method for analyzing a gas by mass spectrometry, and mass spectrometer
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•••
Patent Inventor Names
Martin Gilar
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Joseph A. Jarrell
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11842891
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Patent Primary Examiner
Kiet T Nguyen
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CPC Code
G01N 27/623
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G01N 27/622
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G01N 33/6848
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G01N 30/62
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H01J 49/025
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H01J 49/0031
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H01J 49/164
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H01J 49/40
0
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