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US Patent 11853196 Artificial intelligence driven testing

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
September 25, 2020
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Date of Patent
December 26, 2023
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Patent Application Number
17032411
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Patent Citations
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US Patent 10049030 System and method for test output evaluation of a JAVA component
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US Patent 10073763 Touchless testing platform
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US Patent 10169331 Text mining for automatically determining semantic relatedness
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US Patent 10204033 Method and system for semantic test suite reduction
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US Patent 10339036 Test automation using multiple programming languages
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US Patent 10372592 Automatic pre-detection of potential coding issues and recommendation for resolution actions
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US Patent 10417120 Pluggable fault detection tests for data pipelines
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US Patent 10635574 Screenshot testing of applications on windows desktop environments
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US Patent 10564939 Method and system for arbitrary-granularity execution clone detection
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US Patent 10684943 Generating executable test automation code automatically according to a test case
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•••
Patent Inventor Names
Anil Kumar Pandurangarao
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11853196
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Patent Primary Examiner
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Wei Y. Zhen
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