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US Patent 11858042 Open loop parameter optimization for additive manufacturing

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
August 24, 2021
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Date of Patent
January 2, 2024
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Patent Application Number
17410898
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Patent Citations
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US Patent 10421267 Method to monitor additive manufacturing process for detection and in-situ correction of defects
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US Patent 10252335 Accurate three-dimensional printing
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US Patent 10753955 Systems and method for advanced additive manufacturing
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US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control
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US Patent 10112262 System and methods for real-time enhancement of build parameters of a component
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Patent Inventor Names
Jeffrey L. Riemann
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Kurt Moran
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Michael Juhasz
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11858042
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Patent Primary Examiner
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Michael J. Brown
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CPC Code
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B22F 12/41
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B22F 12/90
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B22F 2203/11
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B33Y 10/00
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B33Y 50/02
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B22F 10/368
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B22F 10/366
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B22F 10/25
0
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B22F 10/85
0

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