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US Patent 11859969 Measurement device

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
October 28, 2022
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Date of Patent
January 2, 2024
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Patent Application Number
17976612
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Patent Citations
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US Patent 10837752 Method for capturing dynamic vibrations of a roughness sensor, method for measuring a roughness of a workpiece surface, computer program product and measuring device configured to carry out the methods
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US Patent 9151588 Method of measuring a circular shape characteristic and circular shape characteristic measuring device and program
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US Patent 6874243 Measuring instrument
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Patent Inventor Names
Hideki Morii
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Takuya Inoue
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11859969
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Patent Primary Examiner
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Yaritza Guadalupe-McCall
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CPC Code
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G01B 5/14
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G01B 5/20
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G01B 5/28
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G01B 3/563
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G01B 3/004
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G01B 5/0014
0

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