US Patent 11860103 Sample identification

A method of analyzing a sample is disclosed. The method includes the steps of measuring a spectral response of the sample, selecting a reference material having a Raman peak with a magnitude at a wave number, measuring a peak value in the spectral response at the wave number, and determining an amount of the reference material in the sample based in part on a ratio of the measured peak value to the magnitude of the Raman peak of the reference material.