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US Patent 11862242 Matching patterns in memory arrays
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Patent
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Date Filed
March 9, 2022
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Date of Patent
January 2, 2024
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Patent Applicant
Micron Technology
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Patent Application Number
17690223
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Patent Citations
US Patent 9627091 Memory device and stress testing method of same
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US Patent 11276463 Matching patterns in memory arrays
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US Patent 9679621 Semiconductor device and semiconductor system
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US Patent 7362633 Parallel read for front end compression mode
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US Patent 7872931 Integrated circuit with control circuit for performing retention test
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US Patent 8441861 Self-check calibration of program or erase and verify process using memory cell distribution
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US Patent 8463988 System and method for matching patterns
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Patent Citations Received
US Patent 12094516 Method and apparatus for intensifying current leakage between adjacent memory cells, and method and apparatus for current leakage detection
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Patent Inventor Names
Dmitri Yudanov
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11862242
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Patent Primary Examiner
Pho M Luu
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CPC Code
G11C 13/004
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G11C 13/0026
0
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