Patent attributes
A spectrometer includes a transparent substrate including a first surface and a second surface that face each other and are substantially parallel to each other; a slit provided on the first surface and through which light is incident onto the transparent substrate; a spectrum optical system including metasurface including a plurality of nanostructures that are two-dimensionally arranged and satisfy a sub-wavelength scattering condition, wherein the metasurface includes a focusing metasurface which includes first nanostructures of the plurality of nanostructures, and is configured to reflect, disperse, and focus the light incident thereon through the slit, at different angles based on respective wavelengths; and a sensor configured to receive the light from the focusing metasurface. When L is a total length of an optical path from the slit to the sensor and D is a thickness of the transparent substrate, L and D satisfy the following inequality: L/D>3.
