US Patent 11868208 System, method, and computer program for defect resolution

As described herein, a system, method, and computer program are provided for defect resolution. Information associated with a defect detected in a computer system is received. The information is processed, using a first machine learning model, to predict a source of the defect. The information and the source of the defect are processed, using a second machine learning model, to predict one or more parameters for handling the defect. One or more actions are caused to be performed to resolve the defect, based on the predicted one or more parameters for handling the defect.