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US Patent 11874414 Device and method for measuring electron beam

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
April 8, 2021
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Date of Patent
January 16, 2024
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Patent Application Number
17225726
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Patent Citations
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US Patent 9469530 Method for transferring carbon nanotube array and method for forming carbon nanotube structure
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US Patent 11320547 Device and method for detecting electron beam
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US Patent 7641885 Method for making a carbon nanotube film
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US Patent 9481125 Method for making patterned carbon nanotube array and carbon nanotube device
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Patent Inventor Names
Guo Chen
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Ke Zhang
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Kai-Li Jiang
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Shou-Shan Fan
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Peng Liu
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11874414
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Patent Primary Examiner
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Kiet T Nguyen
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CPC Code
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C01B 32/158
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G01T 1/2914
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G01T 1/29
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G01T 7/00
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H01J 37/244
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H01J 2237/24542
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H01J 2237/24405
0

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