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US Patent 11894442 Full nanosheet airgap spacer
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Patent
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Date Filed
June 25, 2021
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Date of Patent
February 6, 2024
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Patent Application Number
17358275
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Patent Citations
US Patent 10553696 Full air-gap spacers for gate-all-around nanosheet field effect transistors
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US Patent 10910470 Nanosheet transistors with inner airgaps
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US Patent 10692991 Gate-all-around field effect transistors with air-gap inner spacers and methods
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US Patent 10971585 Gate spacer and inner spacer formation for nanosheet transistors having relatively small space between adjacent gates
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US Patent 9853132 Nanosheet MOSFET with full-height air-gap spacer
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US Patent 9954058 Self-aligned air gap spacer for nanosheet CMOS devices
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Patent Inventor Names
Ruilong Xie
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Kangguo Cheng
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Lan Yu
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Reinaldo Vega
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Jingyun Zhang
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11894442
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Patent Primary Examiner
Tong-Ho Kim
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CPC Code
H01L 29/0665
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H01L 29/42392
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H01L 29/0673
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H01L 29/775
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H01L 29/66439
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B82Y 10/00
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H01L 29/78696
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H01L 29/66742
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H01L 29/66553
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H01L 29/66545
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