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US Patent 11907685 Structure and method for random code generation

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
November 8, 2019
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Date of Patent
February 20, 2024
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Patent Application Number
16677717
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Patent Citations
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US Patent 8861736 Reliable physical unclonable function for device authentication
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US Patent 9025386 Embedded charge trap multi-time-programmable-read-only-memory for high performance logic technology
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US Patent 9337837 Physical unclonable function generation and management
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US Patent 9355739 Bitline circuits for embedded charge trap multi-time-programmable-read-only-memory
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US Patent 9391030 On-chip semiconductor device having enhanced variability
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US Patent 9418745 Rebalancing in twin cell memory schemes to enable multiple writes
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US Patent 9589658 Disturb free bitcell and array
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US Patent 9923046 Semiconductor device resistor structure
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US Patent 9953727 Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
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US Patent 9947391 SRAM based physically unclonable function and method for generating a PUF response
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•••
Patent Inventor Names
Daniel Jaeger
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Judson R. Holt
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George R. Mulfinger
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Ryan W. Sporer
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Julien Frougier
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11907685
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Patent Primary Examiner
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Ellen Tran
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CPC Code
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H04L 2209/12
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H04L 9/3278
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G06F 7/588
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H01L 21/02233
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