Patent attributes
Systems and methods are described herein for use in predicting impedance values or responses in a three-dimensional space. Broadly, an impedance potential field and its measurement characteristics is modeled in an impedance model such that an impedance measurement may be estimated for any location within the impedance potential field. The impedance model may evolve over time based on actual impedance measurements of electrodes located in the three-dimensional space. Initially a plurality of patch electrodes to provide an impedance field to a three-dimensional space while electrodes disposed in the impedance field measure impedances. While each patch is driven, a number of independent impedance fields exist between the non-driven patches. These independent impedance potential fields may be estimated and mapped to impedance measurements of the electrode(s) at locations(s) within the impedance field to model the impedance field.
