Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

US Patent 11921059 Inspection apparatus and inspection method

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
July 11, 2023
0
Date of Patent
March 5, 2024
0
Patent Application Number
18350093
0
Patent Citations
‌
US Patent 11004646 X-ray tube and X-ray generation device
0
‌
US Patent 11467107 X-ray analysis apparatus and x-ray generation unit
0
‌
US Patent 6850598 X-ray anode and process for its manufacture
0
‌
US Patent 7221731 X-ray microscopic inspection apparatus
0
‌
US Patent 7916834 Small spot X-ray fluorescence (XRF) analyzer
0
‌
US Patent 9213007 Foreign matter detector
0
‌
US Patent 9551677 Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
0
‌
US Patent 9594036 X-ray surface analysis and measurement apparatus
0
‌
US Patent 10295486 Detector for X-rays with high spatial and high spectral resolution
0
‌
US Patent 10803574 Inline x-ray measurement apparatus and method
0
•••
Patent Inventor Names
Takeo Tsukamoto
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
11921059
0
Patent Primary Examiner
‌
Thomas R Artman
0

Find more entities like US Patent 11921059 Inspection apparatus and inspection method

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo