Patent attributes
Device configurations for a machine-learned model. A device analytics system includes an electronic processor configured to determine, for a machine-learned model configured to detect a plurality of features, a prioritization ranking for a plurality of input parameters provided to the machine-learned model and receive, for each device, a confidence value for each feature included in the plurality of features. The electronic processor is configured to determine, for each device included in the plurality of devices, a performance value for each feature included in the plurality of features based on the prioritization ranking for the plurality of input parameters and the confidence value for each feature for the respective device. The electronic processor is configured to select, based on the performance value for each device included in the plurality of devices for a feature, a device configuration for the machine-learned model, and implement the selected device configuration.
