US Patent 11927550 Sample mounting system for an X-ray analysis apparatus
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US Patent 11927550 Sample mounting system for an X-ray analysis apparatus
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Patent abstract
The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.
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Patent Inventor Names
Detlef Beckers0
Jaap Boksem0
Date of Patent
March 12, 2024
0Patent Application Number
175474790
Date Filed
December 10, 2021
0Patent Citations
Patent Primary Examiner
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